주요업무
Providing support for Wafer Sort (CP) and Final Test (FT) activities on the Amkor test floor, handling a range of equipment including testers, handlers, and probers.
Applying strong technical and troubleshooting skills to debug hardware and software issues across control plane and fault tolerance environments.
Analyzing yield relationships and investigating root causes across Wafer Sort (CP) and Final Test (FT), pinpointing issues and promoting resolution.
Monitoring pre-test preparation of materials and hardware, setting up test environments, and ensuring smooth execution of test programs.
Ensuring testing is performed as required, actively debugging and resolving issues related to test yield, correlation, and equipment performance.
Bringing to bear modern data analysis and AI-assisted tools to improve debugging efficiency, identify failure patterns, and support data-driven decision making.
Collaborating closely with local planning, engineering, and management teams, as well as communicating with NVIDIA global teams.
Maintaining strong attention to detail, organization, and communication skills, and adapting to changing priorities in a fast-paced production environment.